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VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon) - Hardcover

Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing

 
9780123705976: VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)
Hardcover
ISBN 10: 0123705975 ISBN 13: 9780123705976
Verlag: Morgan Kaufmann, 2006

Inhaltsangabe

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

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Über die Autorinnen und Autoren

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Kwang-Ting (Tim) Cheng, Ph.D., is a Professor and Chair of the Electrical and Computer Engineering Department at the University of California, Berkeley. A Fellow of the IEEE, he has published over 300 technical papers, co-authored three books, and holds 11 U.S. Patents.

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Verlag
Morgan Kaufmann
Erscheinungsdatum
2006
Sprache
Englisch
ISBN 10 
0123705975
ISBN 13 
9780123705976
Einband
Gebundene Ausgabe
Anzahl der Seiten
808
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Verantwortliche Person
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