Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (Volume 163) (Advances in Imaging and Electron Physics, Volume 163) - Hardcover

Hardcover

ISBN 10: 012381314X ISBN 13: 9780123813145

Verlag: Academic Press Inc, 2010

Inhaltsangabe

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Über diesen Titel

Über die Autorin bzw. den Autor

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Details zur Ausgabe

• Verlag: Academic Press Inc
• Erscheinungsdatum: 2010
• Sprache: Englisch
• ISBN 10: 012381314X
• ISBN 13: 9780123813145
• Einband: Tapa dura
• Anzahl der Seiten: 248
• Kontakt zum Hersteller: Nicht verfügbar
• Verantwortliche Person: Yeepin GmbH; 492000000000; sunshine12232@outlook.com; ; Alleestr.11; Kaiserslautern; Rheinland-Pfalz; 67655; Deutschland