Digital Circuit Testing: A Guide to DFT and Other Techniques - Hardcover

Wong, Francis C.

Hardcover

ISBN 10: 0127345809 ISBN 13: 9780127345802

Verlag: Academic Press, 1991

Inhaltsangabe

Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

Details zur Ausgabe

• Verlag: Academic Press
• Erscheinungsdatum: 1991
• Sprache: Englisch
• ISBN 10: 0127345809
• ISBN 13: 9780127345802
• Einband: Gebundene Ausgabe
• Anzahl der Seiten: 228
• Kontakt zum Hersteller: Elsevier GmbH; https://www.elsevier.com/; ; Jägerstraße 41; Berlin; Berlin; 10117; Deutschland