Introduction to Scanning Tunneling Microscopy: 4 (Oxford Series in Optical & Imaging Sciences) - Hardcover

Chen, C. Julian

 
9780195071504: Introduction to Scanning Tunneling Microscopy: 4 (Oxford Series in Optical & Imaging Sciences)
Hardcover
ISBN 10: 0195071506 ISBN 13: 9780195071504
Verlag: Oxford University Press, 1993

Inhaltsangabe

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

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Reseña del editor

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

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Verlag
Oxford University Press
Erscheinungsdatum
1993
Sprache
Englisch
ISBN 10 
0195071506
ISBN 13 
9780195071504
Einband
Tapa dura
Anzahl der Seiten
472
Kontakt zum Hersteller
Oxford University Press
https://corp.oup.com/

WMF Platz 1
Geislingen/Steige
Baden-W?rttemberg
73312
Deutschland

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9780199211500: Introduction to Scanning Tunneling Microscopy: 64 (Monographs on the Physics and Chemistry of Materials)

Vorgestellte Ausgabe

ISBN 10:  0199211507 ISBN 13:  9780199211500
Verlag: OUP Oxford, 2007
Hardcover