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An Introduction to Mixed-Signal IC Test and Measurement (The Oxford Series in Electrical and Computer Engineering) - Hardcover

Roberts, Gordon; Taenzler, Friedrich; Burns, Mark

 
9780199796212: An Introduction to Mixed-Signal IC Test and Measurement (The Oxford Series in Electrical and Computer Engineering)

Inhaltsangabe

The most trusted guide for mixed-signal IC test and measurement

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Über die Autorin bzw. den Autor

Gordon Roberts is James McGill Professor in the Department of Electrical and Computer Engineering at McGill University. He has conducted extensive research on analog integrated circuit design and mixed-signal test issues. Dr. Roberts has published numerous papers at IEEE conferences, coauthored several textbooks related to mixed-signal test and analog integrated circuit design (including SPICE, Second Edition, with Adel Sedra, OUP, 1996), and contributed various specialized volumes to other books.

Friedrich Taenzler is an RF-Engineering Manager at Texas Instruments and a major contributor in the field of RF testing and design.

Mark Burns is a former TI fellow at Texas Instruments and an accomplished expert in mixed-signal IC test and measurement area.

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