Surface and Interface Characterization by Electron Optical Methods (NATO Asi Series: Series B: Physics) - Hardcover
Inhaltsangabe
Proceedings held April 1987. Some topics considered include: transmission imaging of surfaces, fundamentals of high resolution transmission electron microscopy, surface microanalysis and microscopy by x-ray photoeletron spectroscopy, core-loss spectroscopy, and Auger electron spectroscopy, spin-polarized secondary electrons from ferromagnets, intensity oscillations in reflection high energy electron diffraction during epitaxial growth. Annotation copyright Book News, Inc. Portland, Or.
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