Surface and Interface Characterization by Electron Optical Methods: Vol 191 (NATO ASI Series B: Physics) - Hardcover
Inhaltsangabe
Proceedings held April 1987. Some topics considered include: transmission imaging of surfaces, fundamentals of high resolution transmission electron microscopy, surface microanalysis and microscopy by x-ray photoeletron spectroscopy, core-loss spectroscopy, and Auger electron spectroscopy, spin-polarized secondary electrons from ferromagnets, intensity oscillations in reflection high energy electron diffraction during epitaxial growth. Annotation copyright Book News, Inc. Portland, Or.
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Proceedings held April 1987. Some topics considered include: transmission imaging of surfaces, fundamentals of high resolution transmission electron microscopy, surface microanalysis and microscopy by x-ray photoeletron spectroscopy, core-loss spectroscopy, and Auger electron spectroscopy, spin-polarized secondary electrons from ferromagnets, intensity oscillations in reflection high energy electron diffraction during epitaxial growth. Annotation copyright Book News, Inc. Portland, Or.
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Surface and Interface Characterization by Electron Optical Methods (NATO Asi Series: Series B: Physics)
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Hardcover. Zustand: Very Good. Illus. 319 pp. Shelf wear/light soiling. Bumping/wear to corners and edges. Interior is clean. > Language: English | > Size: 8vo - over 7 3/4 in - 9 3/4 in Tall | > Media/Binding: Hardcover |. Bestandsnummer des Verkäufers CORV-BBC-0K28540