GaN Transistor Modeling for RF and Power Electronics: Using The ASM-HEMT Model (Woodhead Publishing Series in Electronic and Optical Materials) - Softcover

Chauhan, Yogesh Singh; Pampori, Ahtisham Ul Haq; Ahsan, Sheikh Aamir

Softcover

ISBN 10: 0323998712 ISBN 13: 9780323998710

Verlag: Woodhead Publishing, 2024

Inhaltsangabe

GaN Transistor Modeling for RF and Power Electronics: Using The ASM-GaN-HEMT Model covers all aspects of characterization and modeling of GaN transistors for both RF and Power electronics applications. Chapters cover an in-depth analysis of the industry standard compact model ASM-HEMT for GaN transistors. The book details the core surface-potential calculations and a variety of real device effects, including trapping, self-heating, field plate effects, and more to replicate realistic device behavior. The authors also include chapters on step-by-step parameter extraction procedures for the ASM-HEMT model and benchmark test results.

GaN is the fastest emerging technology for RF circuits as well as power electronics. This technology is going to grow at an exponential rate over the next decade. This book is envisioned to serve as an excellent reference for the emerging GaN technology, especially for circuit designers, materials science specialists, device engineers and academic researchers and students.

• Provides an overview of the operation and physics of GaN-based transistors
• Features in-depth description (by the developers of the model) of all aspects of the industry standard ASM-HEMT model for GaN circuits
• Details parameter extraction of GaN devices and measurement data requirements for GaN model extraction

Über diesen Titel

Über die Autorinnen und Autoren

Yogesh Singh Chauhan is a Chair Professor in the Department of Electrical Engineering at the Indian Institute of Technology Kanpur, India. He is the developer of several industry standard models: ASM-HEMT, BSIM-BULK (formerly BSIM6), BSIM-CMG, BSIM-IMG, BSIM4 and BSIM-SOI models. His research group is involved in developing compact models for GaN transistors, FinFET, nanosheet/gate-all-around FETs, FDSOI transistors, negative capacitance FETs and 2D FETs. His research interests are RF characterization, modeling, and simulation of semiconductor devices.

Ahtisham Ul Haq Pampori is a postdoctoral researcher at the Berkeley Device Modeling Center (BDMC), University of California, Berkeley. His research focuses on developing advanced semiconductor device models, particularly next-generation BSIM models for field-effect transistors. He earned his doctorate from the Indian Institute of Technology Kanpur, with a focus on GaN HEMT RF device characterization and modeling. A recipient of the Prime Minister’s Research Fellowship, Ahtisham has extensive industry experience collaborating on GaN HEMT characterization and modeling. Prior to academia, he was an Associate Consultant at Frost & Sullivan, specializing in Cloud and Big Data.

Sheikh Aamir Ahsan possesses expertise in state-of-the-art RF and power GaN SPICE models. Originating from the development of the ASM GaN model during his doctoral studies at IIT Kanpur, presently serving as an Assistant Professor at the National Institute of Technology Srinagar (NITSRI), his team leads the advancement of power GaN technology through modeling and design enablement frameworks. Acting as a consultant for multiple industrial partners, his impact extends beyond academia, as his GaN research seamlessly integrates into commercial SPICE simulators, influencing the trajectory of GaN product development and application globally. He was awarded the Startup Research Grant in 2019 by the Science and Engineering Research Board, India.

Von der hinteren Coverseite

The aim of GaN Transistor Modeling for RF and Power Electronics is to cover all aspects of characterization and modelling of GaN transistors for both RF and Power electronics applications. Chapters cover an in-depth analysis of the industry standard compact model ASM-HEMT for GaN transistors. The book details the core surface-potential calculations and a variety of real device effects including trapping, self-heating, field plate effects etc to replicate realistic device behavior. The authors also include chapters on step-by-step parameter extraction procedures for the ASM-HEMT model and benchmark test results.

GaN is the fastest emerging technology for RF circuits as well as Power electronics. This technology is going to grow at an exponential rate over the next decade. This book is envisioned to serve as an excellent reference for the emerging GaN technology especially for circuit designers, materials science and device engineers as well as academic researchers and students.

Details zur Ausgabe

• Verlag: Woodhead Publishing
• Erscheinungsdatum: 2024
• ISBN 10: 0323998712
• ISBN 13: 9780323998710
• Einband: Tapa blanda
• Sprache: Englisch
• Anzahl der Seiten: 260
• Kontakt zum Hersteller: Nicht verfügbar