DNA Damage Recognition - Softcover

Softcover

ISBN 10: 0367392135 ISBN 13: 9780367392130

Verlag: CRC Press, 2019

Inhaltsangabe

Stands as the most comprehensive guide to the subject—covering every essential topic related to DNA damage identification and repair.

Covering a wide array of topics from bacteria to human cells, this book summarizes recent developments in DNA damage repair and recognition while providing timely reviews on the molecular mechanisms employed by cells to distinguish between damaged and undamaged sites and stimulate the appropriate repair pathways.

about the editors...

WOLFRAM SIEDE is Associate Professor, Department of Cell Biology and Genetics, University of North Texas Health Science Center, Fort Worth. He received the Ph.D. degree (1986) from Johann Wolfgang Goethe University, Frankfurt Germany.

YOKE WAH KOW is Professor, Department of Radiation Oncology, Emory University School of Medicine, Atlanta, Georgia. He received the Ph.D. degree (1981) from Brandeis University, Waltham, Massachusetts.

PAUL W. DOETSCH is Professor, Departments of Biochemistry, Radiation Oncology, and Hematology and Oncology, and Associate Director for Basic Research, Winship Cancer Institute, Emory University School of Medicine, Atlanta, Georgia. He received the Ph.D. degree (1982) from Temple University School of Medicine, Philadelphia, Pennsylvania.

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Über die Autorin bzw. den Autor

Wolfram Siede, Yoke Wah Kow, Paul W. Doetsch

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Covering an array of topics, this authoritative work summarizes recent developments, while providing timely reviews on the molecular mechanisms employed by cells to distinguish between damaged and undamaged sites and stimulate the appropriate repair pathways. Richly illustrated, this guide discusses the theoretical aspects of DNA damage recognition, exploring those that are relevant for various regulatory responses, such as transcriptional regulation or checkpoint arrest. It also details key concepts in the recognition of bulky DNA base damage, reviews the excision repair of non-bulky base damage, covers short-patch repair and the recognition and repair of single- and double-strand breaks.

Details zur Ausgabe

• Verlag: CRC Press
• Erscheinungsdatum: 2019
• Sprache: Englisch
• ISBN 10: 0367392135
• ISBN 13: 9780367392130
• Einband: Taschenbuch
• Anzahl der Seiten: 845
• Herausgeber: Siede Wolfram, Kow Yoke Wah, Doetsch Paul W.
• Kontakt zum Hersteller: preigu GmbH & Co. KG; mail@preigu.de; ; Lengericher Landstr. 19; Osnabrück; Niedersachsen; 49078; Deutschland