Advanced VLSI Design and Testability Issues - Hardcover

Hardcover

ISBN 10: 0367492822 ISBN 13: 9780367492823

Verlag: CRC Press, 2020

Inhaltsangabe

This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.

Über diesen Titel

Über die Autorin bzw. den Autor

Suman Lata Tripathi is associated with Lovely Professional University, Phagwara, Punjab, as Professor with more than seventeen years of experience in academics. Her area of expertise includes microelectronics device modeling and characterization, low power VLSI circuit design, VLSI design of testing and advance FET design for IOT and biomedical applications etc.

Sobhit Saxena is an Associate Professor at Lovely Professional University University, Phagwara, Punjab. His area of expertise includes nanomaterial synthesis and characterization, electrochemical analysis and modeling and simulation of CNT based interconnects for VLSI circuits.

S. K. Mohapatra is working as Assistant Professor, in School of Electronics Engineering, Kalinga Institute of Industrial Technology, Bhubaneswar. His research interests include Modeling and Simulation of Nanoscale Devices and its application in IoT. Energy efficient Wireless Sensor Networking, Adhoc Networks, Cellular Communications, Metamaterial absorbers in THz application, UWB-MIMO Antenna, Reconfigurable Antenna, Performance enhancement for high frequency.

Details zur Ausgabe

• Verlag: CRC Press
• Erscheinungsdatum: 2020
• Sprache: Englisch
• ISBN 10: 0367492822
• ISBN 13: 9780367492823
• Einband: Tapa dura
• Auflage: 1
• Anzahl der Seiten: 378
• Herausgeber: Tripathi Suman Lata, Saxena Sobhit, Mohapatra Sushanta Kumar
• Kontakt zum Hersteller: Nicht verfügbar
• Verantwortliche Person: Nicht verfügbar