Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM - Hardcover

Egerton, R.F.

 
9780387258003: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
Hardcover
ISBN 10: 0387258000 ISBN 13: 9780387258003
Verlag: Springer, 2005

Inhaltsangabe

Scanning and stationary-beam electron microscopes have become an indespensible tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and current practice of electron microscopy, aimed primarily at undergraduates who need to learn how the basic principles of physics are applied in an important area of science and technology that has contributed greatly to our knowledge of life processes and "inner space." However, it will be equally valuable for technologists who make use of electron microscopes and for graduate students, university teachers and researchers who need a concise text that deals with the basic principles of microscopy. Less technical but broader in scope than other microscopy textbooks, Physical Principles of Electron Microscopy is appropriate for undergraduates and technologists with limited mathematical training.

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Von der hinteren Coverseite

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

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Verlag
Springer
Erscheinungsdatum
2005
Sprache
Englisch
ISBN 10 
0387258000
ISBN 13 
9780387258003
Einband
Gebundene Ausgabe
Auflage
1
Anzahl der Seiten
214
Kontakt zum Hersteller
ROXIO
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Friedrich-Karl-Str. 9
Hamburg
22391
Deutschland

Weitere beliebte Ausgaben desselben Titels

9783319819860: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Vorgestellte Ausgabe

ISBN 10:  3319819860 ISBN 13:  9783319819860
Verlag: Springer, 2018
Softcover