Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale - Hardcover

Kalinin, Sergei V.; Gruverman, Alexei

 
9780387286679: Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale
Hardcover
ISBN 10: 0387286675 ISBN 13: 9780387286679
Verlag: Springer, 2006

Inhaltsangabe

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

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Von der hinteren Coverseite

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

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Verlag
Springer
Erscheinungsdatum
2006
Sprache
Englisch
ISBN 10 
0387286675
ISBN 13 
9780387286679
Einband
Gebundene Ausgabe
Anzahl der Seiten
1018
Kontakt zum Hersteller
Springer Palgrave Macmillan
buchhandel-buch@springer.com

Tiergartenstr. 17
Heidelberg
69121
Deutschland

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9781493950362: Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale

Vorgestellte Ausgabe

ISBN 10:  1493950363 ISBN 13:  9781493950362
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Softcover