Digital Noise Monitoring of Defect Origin (Lecture Notes in Electrical Engineering, 2, Band 2) - Hardcover

Aliev, Telman

Hardcover

ISBN 10: 0387717536 ISBN 13: 9780387717531

Verlag: Springer, 2007

Inhaltsangabe

Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.

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Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.

Details zur Ausgabe

• Verlag: Springer
• Erscheinungsdatum: 2007
• Sprache: Englisch
• ISBN 10: 0387717536
• ISBN 13: 9780387717531
• Einband: Gebundene Ausgabe
• Anzahl der Seiten: 236
• Kontakt zum Hersteller: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3,69115 Heidelberg, Germany; Heidelberg; 69115; Deutschland