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Inhaltsangabe
This text provides an introduction to the testing of modern digital circuits. Readers will require little previous knowledge of the subject, apart from an understanding of Boolean algebra (including an appreciation of Karnaugh maps and state transition diagrams) and some acquaintenance with standard digital components. The author gives an introduction to the subject, explaining its importance and laying down the principles on which test pattern generation is based. He points out the difficulties that can arise when generating test patterns for unstructured circuits and describes the principles and practice of structured design for testability. Questions at the end of each chapter reinforce the material in the chapter; solution guides are given in a separate chapter at the end of the book. There is also a detailed annotated bibliography covering the standard literature as well as the latest research. This book should be of interest to second and third year undergraduate and diploma students of electrical and electronic engineering; graduate students of information technology, computer science and electronics.
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This text provides an introduction to the testing of modern digital circuits. Readers will require little previous knowledge of the subject, apart from an understanding of Boolean algebra (including an appreciation of Karnaugh maps and state transition diagrams) and some acquaintenance with standard digital components. The author gives an introduction to the subject, explaining its importance and laying down the principles on which test pattern generation is based. He points out the difficulties that can arise when generating test patterns for unstructured circuits and describes the principles and practice of structured design for testability. Questions at the end of each chapter reinforce the material in the chapter; solution guides are given in a separate chapter at the end of the book. There is also a detailed annotated bibliography covering the standard literature as well as the latest research. This book should be of interest to second and third year undergraduate and diploma students of electrical and electronic engineering; graduate students of information technology, computer science and electronics.
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- VerlagCengage Learning EMEA
- Erscheinungsdatum1986
- ISBN 10 0412383608
- ISBN 13 9780412383601
- EinbandTapa blanda
- SpracheEnglisch
- Anzahl der Seiten208
- Kontakt zum HerstellerNicht verfügbar
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Testing Digital Circuits: An Introduction (Aspects of Information Technology S.)
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Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,350grams, ISBN:9780412383601. Bestandsnummer des Verkäufers 5826717
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Testing Digital Circuits: An Introduction (Aspects of Information Technology S.)
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Zustand: Good. Most items will be dispatched the same or the next working day. A copy that has been read but remains in clean condition. All of the pages are intact and the cover is intact and the spine may show signs of wear. The book may have minor markings which are not specifically mentioned. Bestandsnummer des Verkäufers wbs6743561957
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Testing Digital Circuits: An Introduction (Aspects of Information Technology S.)
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,400grams, ISBN:9780412383601. Bestandsnummer des Verkäufers 9932013
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