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Passive Films, Surface Structure and Stress Corrosion and Crevice Corrosion Susceptibility (Classic Reprint) - Hardcover

Kruger, J.

 
9780428394523: Passive Films, Surface Structure and Stress Corrosion and Crevice Corrosion Susceptibility (Classic Reprint)

Inhaltsangabe

Excerpt from Passive Films, Surface Structure and Stress Corrosion and Crevice Corrosion Susceptibility

Field ion microscopy (fim) is capable of imaging defects such as sub-critical crack formation and growth, and surface rearrangements, and of detecting new surface phase formations, and other disturbances.

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