Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements (Classic Reprint) - Hardcover

Jesch, Ramon L.

Hardcover

ISBN 10: 0428697089 ISBN 13: 9780428697082

Verlag: Forgotten Books, 2018

Inhaltsangabe

Excerpt from Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements

The work performed during the period September 1972 to July 1973 was reported in nbs Special Publication 400-5, Semiconductor Measurement Technology: Measurement of Trans istor Scattering Parameters This special publication describes the results of the interlaboratory comparison of transistor S - parameter measurements and shows how the equiva lent circuit of the HF probe assemblies can be characterized by means of S-parameters using previously - described techniques.

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Details zur Ausgabe

• Verlag: Forgotten Books
• Erscheinungsdatum: 2018
• Sprache: Englisch
• ISBN 10: 0428697089
• ISBN 13: 9780428697082
• Einband: Gebundene Ausgabe
• Anzahl der Seiten: 64
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