During the past 25 years, electronic engineering has witnessed tremendous strides in design, but maintenance of analog electronics has changed little since the vacuum tube, the ability to design complex circuits being greater than the ability to maintain them. The contributors to this volume offer current, theoretical and practical, analog testing and fault diagnosis data. The topics include linear vs. nonlinear methods, a searching approach self-testing algorithm, an artificial intelligence approach, automatic testing for control systems, and a unified theory on test generation. Annotation copyright Book News, Inc. Portland, Or.
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