Inhaltsangabe
Written by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis and combinatorial screening. Experimental examples in materials research, pharmaceuticals, and forensics are also given. This presents a key resource to researchers in materials science, chemistry, physics, and pharmaceuticals, as well as graduate-level students in these areas.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Über die Autorin bzw. den Autor
Bob Baoping He is the Director of R&D and Engineering at Bruker AXS (formerly Siemens AXS). Mr. He holds a PhD in materials science from Virginia Tech and holds twelve U.S. patents.
Von der hinteren Coverseite
The fundamentals, theory, and wide-ranging applications of two-dimensional X-ray diffraction
Two-Dimensional X-Ray Diffraction is proving itself as an ideal non-destructive, analytical method for measuring the atomic arrangement of materials and extracting an array of information beyond the limitations of conventional X-ray diffraction. Researchers in materials science, chemistry, physics, pharmaceuticals, and related fields will find this introductory reference invaluable in understanding and applying two-dimensional X-ray diffraction for examining a broad range of samples.
Two-Dimensional X-Ray Diffraction shows how two-dimensional X-ray diffraction can be a useful tool for the examination of metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials and composites for material science researches, molecular structure determination and polymorphism study for drug discovery and processing, and samples with micro volume or micro-area for forensic analysis, and archaeology analysis, to name just a few of the method's applications.
The text covers:
-
The fundamentals of X-ray diffraction and its extension to two-dimensional X-ray diffraction
-
The geometry conventions and diffraction vector approach for diffraction data interpretation, data correction, and process algorithms for various applications
-
Instrumentation technologies, including the critical components, such as X-ray source and optics, two-dimensional detectors, goniometer, and sample stages
-
The configurations of the two-dimensional X-ray diffraction systems for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening
-
Experimental examples in materials research, pharmaceuticals, materials processing, and quality control
Written by one of the pioneers in the field, Two-Dimensional X-Ray Diffraction brings readers up to speed on a fast-rising, state-of-the-art method for materials characterization.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
Suchergebnisse für Two-dimensional X-ray Diffraction
Beispielbild für diese ISBN
Two-Dimensional X-Ray Diffraction
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
Hardcover. Zustand: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book. Bestandsnummer des Verkäufers ERICA77304702272226
Gebraucht kaufen
EUR 351,75
EUR 28,94 Versand
Versand von Vereinigtes Königreich nach USA
Versand von Vereinigtes Königreich nach USA
Anzahl: 1 verfügbar