In Situ Real Time Characterization of Thin Films: Edited by Orlando Auciello, Alan R. Krauss - Hardcover

 
9780471241416: In Situ Real Time Characterization of Thin Films: Edited by Orlando Auciello, Alan R. Krauss
Hardcover
ISBN 10: 0471241415 ISBN 13: 9780471241416
Verlag: John Wiley & Sons Inc, 2000

Inhaltsangabe

An in-depth look at the state of the art of in situ

real-time monitoring and analysis of thin films

With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include:
* Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes
* Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces
* Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials
* Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes
* X-ray fluorescence spectroscopy for studying surface and interface structures
* And other cost-effective techniques for industrial application

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

Über die Autorin bzw. den Autor

ORLANDO AUCIELLO, PhD, is a Senior Scientist at the Argonne National Laboratory. ALAN R. KRAUSS, PhD, (deceased) was a Senior Scientist at the Argonne National Laboratory.

Von der hinteren Coverseite

An in-depth look at the state of the art of in situ

real-time monitoring and analysis of thin films

With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include:
* Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes
* Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces
* Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials
* Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes
* X-ray fluorescence spectroscopy for studying surface and interface structures
* And other cost-effective techniques for industrial application

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag
John Wiley & Sons Inc
Erscheinungsdatum
2000
Sprache
Englisch
ISBN 10 
0471241415
ISBN 13 
9780471241416
Einband
Gebundene Ausgabe
Anzahl der Seiten
263
Herausgeber
Auciello Orlando, Krauss Alan Robert
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
Nicht verfügbar