Inhaltsangabe
This book presents, for the first time, a comprehensive survey ofanalytical techniques currently used in support of all stages ofmicroelectronic materials and device processing. The diversity oftopics covered in this book has been achieved by bringing togetheran international field of authors contributing specializedindividual chapters. This has ensured that each technique isdiscussed in detail giving in-depth treatments of the subjectmatter. A particularly helpful feature in this book is the concisetechnical summary given at the end of each section. Four majorareas are considered in this volume:
* Bulk analysis of microelectronic materials
* Analysis of surfaces, interfaces and thin films
* Structure analysis on an atomic scale
* Characterization of physical, electrical and topographicfeatures
Complete with over 400 illustrations, this volume is anindispensible guide to analytical support for the microelectronicindustry.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Über die Autorin bzw. den Autor
M. Grasserbauer and H. W. Werner are the authors of Analysis of Microelectronic Materials and Devices, published by Wiley.
Von der hinteren Coverseite
This book presents, for the first time, a comprehensive survey of analytical techniques currently used in support of all stages of microelectronic materials and device processing. The diversity of topics covered in this book has been achieved by bringing together an international field of authors contributing specialized individual chapters. This has ensured that each technique is discussed in detail giving in-depth treatments of the subject matter. A particularly helpful feature in this book is the concise technical summary given at the end of each section. Four major areas are considered in this volume:
- Bulk analysis of microelectronic materials
- Analysis of surfaces, interfaces and thin films
- Structure analysis on an atomic scale
- Characterization of physical, electrical and topographic features
Aus dem Klappentext
This book presents, for the first time, a comprehensive survey of analytical techniques currently used in support of all stages of microelectronic materials and device processing. The diversity of topics covered in this book has been achieved by bringing together an international field of authors contributing specialized individual chapters. This has ensured that each technique is discussed in detail giving in-depth treatments of the subject matter. A particularly helpful feature in this book is the concise technical summary given at the end of each section. Four major areas are considered in this volume:
- Bulk analysis of microelectronic materials
- Analysis of surfaces, interfaces and thin films
- Structure analysis on an atomic scale
- Characterization of physical, electrical and topographic features
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
Weitere beliebte Ausgaben desselben Titels
Suchergebnisse für Analysis of Microelectronic Materials and Devices
Beispielbild für diese ISBN
Analysis of Microelectronic Materials and Devices
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
Paperback. Zustand: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book. Bestandsnummer des Verkäufers ERICA77304719501306
Gebraucht kaufen
EUR 267,57
EUR 29,25 Versand
Versand von Vereinigtes Königreich nach USA
Versand von Vereinigtes Königreich nach USA
Anzahl: 1 verfügbar