Testing of Digital Systems Hardback - Hardcover

Jha; Gupta

Hardcover

ISBN 10: 0521773563 ISBN 13: 9780521773560

Verlag: Cambridge University Press, 2003

Inhaltsangabe

The most comprehensive and wide ranging book on the testing of semiconductor devices and systems.

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Über die Autorinnen und Autoren

Niraj Jha is Professor of Electrical Engineering at Princeton University and head of the Center of Embedded System-on-a-Chip Design, where his current research is focussed on the synthesis and testing of these devices. He is a fellow of IEEE, associate editor of IEEE Transactions on VLSI Systems and The Journal of Electronic Testing: Theory and Applications (JETTA) and a recipient of the AT&T Foundation award and the NEC preceptorship award for research excellence.

Sandeep Gupta is an Associate Professor in the Department of Electrical Engineering at the University of Southern California, USA. He is Co-Director of the M.S. Program in VLSI Design, with research interests in the area of VLSI testing and design. He is a member of the IEEE.

Details zur Ausgabe

• Verlag: Cambridge University Press
• Erscheinungsdatum: 2003
• Sprache: Englisch
• ISBN 10: 0521773563
• ISBN 13: 9780521773560
• Einband: Tapa dura
• Anzahl der Seiten: 1016
• Kontakt zum Hersteller: Nicht verfügbar
• Verantwortliche Person: Avery; https://www.avery.fr/; ; chemin des peupliers 27; Dardilly; Frankreich