This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
NAN YAO holds several positions at Princeton University, New Jersey. He is director of the Imaging and Analysis Center; Senior Research Scholar at the Institute for the Science and Technology of Materials; and a lecturer in Mechanical and Aerospace Engineering.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Zustand: New. In. Bestandsnummer des Verkäufers ria9780521831994_new
Anzahl: Mehr als 20 verfügbar
Anbieter: Grand Eagle Retail, Bensenville, IL, USA
Hardcover. Zustand: new. Hardcover. The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Bestandsnummer des Verkäufers 9780521831994
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Hardcover. Zustand: Brand New. 1st edition. 395 pages. 9.75x7.00x1.00 inches. In Stock. This item is printed on demand. Bestandsnummer des Verkäufers __0521831997
Anzahl: 1 verfügbar
Anbieter: THE SAINT BOOKSTORE, Southport, Vereinigtes Königreich
Hardback. Zustand: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 978. Bestandsnummer des Verkäufers C9780521831994
Anzahl: Mehr als 20 verfügbar
Anbieter: Books Puddle, New York, NY, USA
Zustand: New. pp. 408. Bestandsnummer des Verkäufers 26397820
Anbieter: CitiRetail, Stevenage, Vereinigtes Königreich
Hardcover. Zustand: new. Hardcover. The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Bestandsnummer des Verkäufers 9780521831994
Anzahl: 1 verfügbar
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Hardcover. Zustand: Like New. Like New. book. Bestandsnummer des Verkäufers ERICA75805218319975
Anzahl: 1 verfügbar
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
Zustand: New. Print on Demand pp. 408 69:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Case Laminate on White w/Gloss Lam. Bestandsnummer des Verkäufers 7450147
Anzahl: 4 verfügbar
Anbieter: moluna, Greven, Deutschland
Gebunden. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuab. Bestandsnummer des Verkäufers 446949426
Anzahl: Mehr als 20 verfügbar
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Hardcover. Zustand: Brand New. 1st edition. 395 pages. 9.75x7.00x1.00 inches. In Stock. Bestandsnummer des Verkäufers x-0521831997
Anzahl: 2 verfügbar