Modeling and Characterization of RF and Microwave Power FETs: Characterization and Modeling of LDMOS and III-V Devices (The Cambridge RF and Microwave Engineering Series) - Hardcover

Buch 1�von 20: Cambridge RF and Microwave Engineering

Aaen, Peter ; Pl�, Jaime A.; Wood, John

9780521870665: Modeling and Characterization of RF and Microwave Power FETs: Characterization and Modeling of LDMOS and III-V Devices (The Cambridge RF and Microwave Engineering Series)

Hardcover

ISBN 10: 0521870666 ISBN 13: 9780521870665

Verlag: Cambridge University Press, 2007

Alle Exemplare dieser ISBN-Ausgabe

1 Gebraucht

Von EUR 69,74

11 Neu

Von EUR 126,16

This book was the first to be devoted to the compact modeling of RF power FETs.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

�ber die Autorin bzw. den Autor

Peter H. Aaen is the Modeling Group Manager in the RF Division at Freescale Semiconductor, Inc., Tempe Arizona. Jaime A. Pia is the Design Organization Manager in the RF Division at Freescale in the RF Division at Freescale Semiconductor, Inc., Tempe Arizona. John Wood is Senior Technical Contributor responsible for RF CAD and Modeling in the RF Division at Freescale Semiconductor, Inc., Tempe, Arizona. He is a Fellow of the IEEE.

��ber diesen Titel� kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag: Cambridge University Press
Erscheinungsdatum: 2007
Sprache: Englisch
ISBN 10: 0521870666
ISBN 13: 9780521870665
Einband: Gebundene Ausgabe
Anzahl der Seiten: 380
Kontakt zum Hersteller: preigu GmbH & Co. KG
mail@preigu.de

Lengericher Landstr. 19
Osnabr�ck
Niedersachsen
49078
Deutschland

Weitere beliebte Ausgaben desselben Titels

9780521336178: Modeling and Characterization of Rf and Microwave Power Fets (Cambridge RF and Microwave Engineering)

Vorgestellte Ausgabe

ISBN 10: 0521336171 ISBN 13: 9780521336178
Verlag: Cambridge University Press, 2011
Softcover

Suchergebnisse f�r Modeling and Characterization of RF and Microwave Power...

Beispielbild f�r diese ISBN

Modeling and Characterization of RF and Microwave Power FETs

Aaen, Peter H; Pla, Jaime A. And Wood, John

Verlag: Cambridge, Cambridge, 2007

ISBN 10: 0521870666 ISBN 13: 9780521870665

Gebraucht Hardcover Erstausgabe

Anbieter: Feldman's Books, Menlo Park, CA, USA

Verk�uferbewertung 5 von 5 Sternen

Hardcover. Zustand: Very Fine. First Edition. No markings. Bestandsnummer des Verk�ufers 00044259

Verk�ufer kontaktieren

Gebraucht kaufen

EUR 69,74

EUR 3,81 Versand
Versand innerhalb von USA

Anzahl: 1 verf�gbar

In den Warenkorb

Beispielbild f�r diese ISBN

Modeling and Characterization of RF and Microwave Power FETs (The Cambridge RF and Microwave Engineering Series)

Aaen, Peter; Pl�, Jaime A.; Wood, John

Verlag: Cambridge University Press, 2007

ISBN 10: 0521870666 ISBN 13: 9780521870665

Neu Hardcover

Anbieter: BennettBooksLtd, Los Angeles, CA, USA

Verk�uferbewertung 5 von 5 Sternen

hardcover. Zustand: New. In shrink wrap. Looks like an interesting title! Bestandsnummer des Verk�ufers Q-0521870666

Verk�ufer kontaktieren

Neu kaufen

EUR 126,16

EUR 5,88 Versand
Versand innerhalb von USA

Anzahl: 1 verf�gbar

In den Warenkorb

Beispielbild f�r diese ISBN

Modeling and Characterization of RF and Microwave Power FETs (The Cambridge RF and Microwave Engineering Series)

Aaen, Peter; Pl�, Jaime A.; Wood, John

Verlag: Cambridge University Press, 2007

ISBN 10: 0521870666 ISBN 13: 9780521870665

Neu Hardcover

Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes K�nigreich

Verk�uferbewertung 5 von 5 Sternen

Zustand: New. In. Bestandsnummer des Verk�ufers ria9780521870665_new

Verk�ufer kontaktieren

Neu kaufen

EUR 148,49

EUR 13,75 Versand
Versand von Vereinigtes K�nigreich nach USA

Anzahl: Mehr als 20 verf�gbar

In den Warenkorb

Beispielbild f�r diese ISBN

Modeling and Characterization of RF and Microwave Power FETs (Hardcover)

Peter Aaen

Verlag: Cambridge University Press, Cambridge, 2007

ISBN 10: 0521870666 ISBN 13: 9780521870665

Neu Hardcover

Anbieter: Grand Eagle Retail, Bensenville, IL, USA

Verk�uferbewertung 5 von 5 Sternen

Hardcover. Zustand: new. Hardcover. This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices. This book was the first to be devoted to the compact modeling of RF power FETs. In it, you will find the techniques, verification and validation procedures required to produce a transistor model. The text also contains real-world examples. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Bestandsnummer des Verk�ufers 9780521870665

Verk�ufer kontaktieren

Neu kaufen

EUR 164,37

Versand gratis
Versand innerhalb von USA

Anzahl: 1 verf�gbar

In den Warenkorb

Beispielbild f�r diese ISBN

Modeling and Characterization of RF and Microwave Power FETs

Peter Aaen/ Jaime A. Pl�/ John Wood

Verlag: Cambridge Univ Pr, 2007

ISBN 10: 0521870666 ISBN 13: 9780521870665

Neu Hardcover

Print-on-Demand

Anbieter: Revaluation Books, Exeter, Vereinigtes K�nigreich

Verk�uferbewertung 5 von 5 Sternen

Hardcover. Zustand: Brand New. 1st edition. 388 pages. 9.75x7.00x1.00 inches. In Stock. This item is printed on demand. Bestandsnummer des Verk�ufers __0521870666

Verk�ufer kontaktieren

Neu kaufen

EUR 158,56

EUR 14,34 Versand
Versand von Vereinigtes K�nigreich nach USA

Anzahl: 1 verf�gbar

In den Warenkorb

Beispielbild f�r diese ISBN

Modeling and Characterization of RF and Microwave Power FETs

Peter Aaen

Verlag: Cambridge University Press, 2007

ISBN 10: 0521870666 ISBN 13: 9780521870665

Neu Hardcover

Print-on-Demand

Anbieter: THE SAINT BOOKSTORE, Southport, Vereinigtes K�nigreich

Verk�uferbewertung 5 von 5 Sternen

Hardback. Zustand: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days. Bestandsnummer des Verk�ufers C9780521870665

Verk�ufer kontaktieren

Neu kaufen

EUR 163,67

EUR 23,08 Versand
Versand von Vereinigtes K�nigreich nach USA

Anzahl: Mehr als 20 verf�gbar

In den Warenkorb

Beispielbild f�r diese ISBN

Modeling and Characterization of RF and Microwave Power FETs (Hardcover)

Peter Aaen

Verlag: Cambridge University Press, Cambridge, 2007

ISBN 10: 0521870666 ISBN 13: 9780521870665

Neu Hardcover

Print-on-Demand

Anbieter: CitiRetail, Stevenage, Vereinigtes K�nigreich

Verk�uferbewertung 5 von 5 Sternen

Hardcover. Zustand: new. Hardcover. This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices. This book was the first to be devoted to the compact modeling of RF power FETs. In it, you will find the techniques, verification and validation procedures required to produce a transistor model. The text also contains real-world examples. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Bestandsnummer des Verk�ufers 9780521870665

Verk�ufer kontaktieren

Neu kaufen

EUR 162,50

EUR 42,46 Versand
Versand von Vereinigtes K�nigreich nach USA

Anzahl: 1 verf�gbar

In den Warenkorb

Foto des Verk�ufers

Modeling and Characterization of RF and Microwave Power FETs

Aaen, Peter|Pl�, Jaime A.|Wood, John

Verlag: Cambridge University Press, 2015

ISBN 10: 0521870666 ISBN 13: 9780521870665

Neu Hardcover

Print-on-Demand

Anbieter: moluna, Greven, Deutschland

Verk�uferbewertung 4 von 5 Sternen

Gebunden. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book was the first to be devoted to the compact modeling of RF power FETs. In it, you will find the techniques, verification and validation procedures required to produce a transistor model. The text also contains real-world examples.&Uumlber . Bestandsnummer des Verk�ufers 446951506

Verk�ufer kontaktieren