Scanning and Transmission Electron Microscopy: An Introduction - Hardcover

Flegler, Stanley L.; Heckman, John W., Jr.; Klomparens, Karen L.

Hardcover

ISBN 10: 0716770474 ISBN 13: 9780716770473

Verlag: W.H.Freeman & Co Ltd, 1993

Inhaltsangabe

This authoritative volume, ideal for use in any laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens.
Since each laboratory has its own procedures, this unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity, this text offers the best introduction to scanning and transmission electron microscopy available.

Über diesen Titel

Über die Autorin bzw. den Autor

Stanley L. Flegler, John W. Heckman, Jr., and Karen L. Klomparens are at the Center for Electron Optics at Michigan State University.

Details zur Ausgabe

• Verlag: W.H.Freeman & Co Ltd
• Erscheinungsdatum: 1993
• Sprache: Englisch
• ISBN 10: 0716770474
• ISBN 13: 9780716770473
• Einband: Gebundene Ausgabe
• Anzahl der Seiten: 320
• Kontakt zum Hersteller: Nicht verfügbar
• Verantwortliche Person: Ufficio Anagrafiche Messaggerie; ufficio.anagrafiche@meli.it; ; Via Verdi, 8; Assago Milano; 20090; Italien