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Scanning Tunneling Microscopy/ Spectroscopy and Related Techniques: 12th International Conference, STM'03: v. 696 (AIP Conference Proceedings) - Hardcover
Inhaltsangabe
At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.
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Reseña del editor
At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.
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Scanning Tunneling Microscopy/Spectroscopy and Related Techniques [With CDROM]
Verlag:
American Institute of Physics, 2003
ISBN 10: 0735401683
ISBN 13: 9780735401686
Gebraucht
Hardcover
Anbieter: ThriftBooks-Atlanta, AUSTELL, GA, USA
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Hardcover. Zustand: Very Good. No Jacket. Former library book; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 1.05. Bestandsnummer des Verkäufers G0735401683I4N10
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