Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of ... (Institute of Physics Conference Series) - Hardcover

Institute Of Physics (Great Britain)

Hardcover

ISBN 10: 0750304413 ISBN 13: 9780750304412

Verlag: Springer-Verlag GmbH, 1997

Inhaltsangabe

Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.

Über diesen Titel

Über die Autorin bzw. den Autor

John M. Rodenburg

Details zur Ausgabe

• Verlag: Springer-Verlag GmbH
• Erscheinungsdatum: 1997
• Sprache: Englisch
• ISBN 10: 0750304413
• ISBN 13: 9780750304412
• Einband: Gebundene Ausgabe
• Anzahl der Seiten: 687
• Herausgeber: Rodenburg J. M.
• Kontakt zum Hersteller: preigu GmbH & Co. KG; mail@preigu.de; ; Lengericher Landstr. 19; Osnabrück; Niedersachsen; 49078; Deutschland