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Nanoscale Standards by Metrological AFM and Other Instruments - Softcover

Misumi, Ichiko

 
9780750331920: Nanoscale Standards by Metrological AFM and Other Instruments

Inhaltsangabe

This book reviews nanometrological standards before proceeding to detail pitch, step height, line width, nanoparticle size, and surface roughness. Essential for users making quantitative nanoscale measurements, in a commercial or academic research setting, or involved in engineering nanometrology for quality control in industrial applications.

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