Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
Gratis für den Versand innerhalb von/der USA
Versandziele, Kosten & DauerEUR 3,65 für den Versand innerhalb von/der USA
Versandziele, Kosten & DauerAnbieter: World of Books (was SecondSale), Montgomery, IL, USA
Zustand: Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc. Bestandsnummer des Verkäufers 00076890417
Anzahl: 1 verfügbar
Anbieter: HPB-Red, Dallas, TX, USA
hardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Bestandsnummer des Verkäufers S_433033971
Anzahl: 1 verfügbar
Anbieter: PsychoBabel & Skoob Books, Didcot, Vereinigtes Königreich
hardcover. Zustand: Very Good. Zustand des Schutzumschlags: No Dust Jacket. Name from previous owner on FEP. No dust jacket. Binding is very well preserved, pages are clean and crisp, and printing is tight, clean and bright throughout. MB. Used. Bestandsnummer des Verkäufers 248551
Anzahl: 1 verfügbar
Anbieter: GoldBooks, Denver, CO, USA
Zustand: new. Bestandsnummer des Verkäufers 14F80_49_0792395646
Anzahl: 1 verfügbar
Anbieter: thebookforest.com, San Rafael, CA, USA
hardcover. Zustand: New. Supporting Bay Area Friends of the Library since 2010. Well packaged and promptly shipped. Bestandsnummer des Verkäufers 1LAUHV003123
Anzahl: 1 verfügbar
Anbieter: GridFreed, North Las Vegas, NV, USA
Hardcover. Zustand: New. In shrink wrap. Bestandsnummer des Verkäufers 90-12126
Anzahl: 1 verfügbar
Anbieter: Lucky's Textbooks, Dallas, TX, USA
Zustand: New. Bestandsnummer des Verkäufers ABLIING23Feb2416190186011
Anzahl: Mehr als 20 verfügbar
Anbieter: GreatBookPrices, Columbia, MD, USA
Zustand: New. Bestandsnummer des Verkäufers 758026-n
Anzahl: Mehr als 20 verfügbar
Anbieter: Books Puddle, New York, NY, USA
Zustand: New. pp. 136 Index. Bestandsnummer des Verkäufers 263093558
Anzahl: 1 verfügbar
Anbieter: Grand Eagle Retail, Bensenville, IL, USA
Hardcover. Zustand: new. Hardcover. The book begins with an introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analogue tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter, and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book should be useful for test engineers, researchers and circuits designers with an interest in IC testing methods. Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Bestandsnummer des Verkäufers 9780792395645
Anzahl: 1 verfügbar