International Workshop Proceedings (Defect and Fault Tolerance in VLSI Systems) - Hardcover

Institute Of Electrical And Electronics Engineers

 
9780818628351: International Workshop Proceedings (Defect and Fault Tolerance in VLSI Systems)
Hardcover
ISBN 10: 0818628359 ISBN 13: 9780818628351
Verlag: IEEE Computer Society Press,U.S., 1993

Inhaltsangabe

Nearly three dozen papers from the November 1992 conference in Dallas, Texas, discuss methods of testing the large circuits used in microelectronics. The sections cover defect and yield modeling, fault tolerant arrays and systems, testing, concurrent error detection, system fault diagnosis, defect and fault modeling, defect tolerance, fault tolerant arithmetics, system testing, and routing for defect tolerance. In addition, invited speakers discuss the WASP project, and the lessons from designing a wafer scale 2D array. No subject index. Annotation copyright Book News, Inc. Portland, Or.

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Reseña del editor

Nearly three dozen papers from the November 1992 conference in Dallas, Texas, discuss methods of testing the large circuits used in microelectronics. The sections cover defect and yield modeling, fault tolerant arrays and systems, testing, concurrent error detection, system fault diagnosis, defect and fault modeling, defect tolerance, fault tolerant arithmetics, system testing, and routing for defect tolerance. In addition, invited speakers discuss the WASP project, and the lessons from designing a wafer scale 2D array. No subject index. Annotation copyright Book News, Inc. Portland, Or.

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag
IEEE Computer Society Press,U.S.
Erscheinungsdatum
1993
Sprache
Englisch
ISBN 10 
0818628359
ISBN 13 
9780818628351
Einband
Tapa dura
Anzahl der Seiten
352
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
Nicht verfügbar