Test Generation for Very Large Scale Integration Chips - Hardcover

Agrawal, Vishwani D.; Seth, S.C.

Hardcover

ISBN 10: 081868786X ISBN 13: 9780818687860

Verlag: IEEE Computer Society Press,U.S., 1988

Inhaltsangabe

Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial. Graphs and illustrations are featured in most pages. Topics include fault modeling, test generation, test evaluation, testability analysis, design for testability, and automatic test equipment. Annotation copyright Book News, Inc. Portland, Or.

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Reseña del editor

Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial.

Details zur Ausgabe

• Verlag: IEEE Computer Society Press,U.S.
• Erscheinungsdatum: 1988
• Sprache: Englisch
• ISBN 10: 081868786X
• ISBN 13: 9780818687860
• Einband: Tapa dura
• Anzahl der Seiten: 400
• Kontakt zum Hersteller: Nicht verfügbar
• Verantwortliche Person: Nicht verfügbar