Inhaltsangabe
This volume covers topics including: yield and defect density; reliability enhancement; defect and fault analysis; testing techniques; fault diagnosis; fault-tolerant designs; high-level synthesis of reliable systems; and yield and reliability issues of analogue and mixed signal circuits.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Reseña del editor
This volume covers topics including: yield and defect density; reliability enhancement; defect and fault analysis; testing techniques; fault diagnosis; fault-tolerant designs; high-level synthesis of reliable systems; and yield and reliability issues of analogue and mixed signal circuits.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
Suchergebnisse für DFT '98 (Defect and Fault Tolerance in VLSI Systems)
Beispielbild für diese ISBN
1998 International Symposium on Defect and Fault Tolerance in VLSI Systems, Proceedings.
ISBN 10: 0818688327
ISBN 13: 9780818688324
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Softcover
Erstausgabe
Anbieter: Alien Bindings, BALTIMORE, MD, USA
Verkäuferbewertung 5 von 5 Sternen
Softcover. Zustand: Very Good. No Jacket. First Edition. Ex research library book. The rear cover is lightly scuffed. The binding is tight. The interior pages are clean and unmarked. Electronic delivery tracking will be issued free of charge. Bestandsnummer des Verkäufers 09052