Particles on Surfaces: Detection, Adhesion, and Removal - Hardcover

 
9780824795351: Particles on Surfaces: Detection, Adhesion, and Removal

Inhaltsangabe

Based on the Fourth Symposium on Particles on Surfaces held recently during the Annual Meeting of the Fine Particle Society in Las Vegas, Nevada, this useful reference presents the latest techniques for the detection, identification, analysis, characterization, and removal of particles found on a wide variety of surfaces.
Covering the fundamental aspects of the discipline as well as the most recent developments and exploring a host of procedures, including light scattering, spectroscopic, x-ray fluorescence, sonication, spray impingement, liquid jets, fluorocarbon surfactant solutions, and laser cleaning, Particles on Surfaces examines adhesion induced particle deformation ... the use of atomic force microscopy in probing particle-particle adhesion ... particle contamination in the fields of microelectronics aerospace, and optical surfaces ... the role of air ionization in reducing surface contamination by particles in the cleanroom ... abrasive blasting media for a contamination-free deburring process ... particle generation and control in tubing and piping connection design ... focused acoustic waves for the investigation of particle behavior ... and much more.
With over 900 literature citations, tables, photographs, drawings, and equations, Particles on Surfaces is an excellent resource for physical, surface, colloid, polymer and adhesion chemists; chemical and assembly engineers; material scientists; semiconductor, microelectronics, and head and disc manufacturers; cleanroom designers; contamination control technologists in the aerospace, automotive, optics, biomedical, and pharmaceutical industries; and upper-level undergraduate and graduate students in these disciplines.

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Über die Autorin bzw. den Autor

K.L.Mittal

Von der hinteren Coverseite

Based on the Fourth Symposium on Particles on Surfaces held recently during the Annual Meeting of the Fine Particle Society in Las Vegas, Nevada, this useful reference presents the latest techniques for the detection, identification, analysis, characterization, and removal of particles found on a wide variety of surfaces. Covering the fundamental aspects of the discipline as well as the most recent developments and exploring a host of procedures, including light scattering, spectroscopic, x-ray fluorescence, sonication, spray impingement, liquid jets, fluorocarbon surfactant solutions, and laser cleaning, Particles on Surfaces examines adhesion induced particle deformation ... the use of atomic force microscopy in probing particle-particle adhesion ... particle contamination in the fields of microelectronics aerospace, and optical surfaces ... the role of air ionization in reducing surface contamination by particles in the cleanroom ... abrasive blasting media for a contamination-free deburring process ... particle generation and control in tubing and piping connection design ... focused acoustic waves for the investigation of particle behavior ... and much more. With over 900 literature citations, tables, photographs, drawings, and equations, Particles on Surfaces is an excellent resource for physical, surface, colloid, polymer and adhesion chemists; chemical and assembly engineers; material scientists; semiconductor, microelectronics, and head and disc manufacturers; cleanroom designers; contamination control technologists in the aerospace, automotive, optics, biomedical, and pharmaceutical industries; and upper-level undergraduate and graduate students in these disciplines.

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