IDDQ Testing for CMOS and VLSI (The Artech House Optoelectronics Library) - Hardcover

Rajsuman, Rochit

 
9780890067260: IDDQ Testing for CMOS and VLSI (The Artech House Optoelectronics Library)
Hardcover
ISBN 10: 0890067260 ISBN 13: 9780890067260
Verlag: Artech House Publishers, 1995

Inhaltsangabe

Provides coverage of IDDQ testing, including discussion of the correlation between physical defects and logical faults, and how IDDQ testing detects these defects. This title presents information on test generation for IDDQ testing; use of stuck-at and random vectors for IDDQ testing; use of IDDQ testing in factory production lines; cost benefit analysis; instrumentation issues; off-chip and on-chip current senors; ATE interface; case studies with memories and microprocessors; and proposed IEE QTAG standards. It also supplies planning guidelines and optimization methods, together with numerous examples ranging from simple circuits to extensive case studies. It should be useful as a reference for designers and test engineers.

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Verlag
Artech House Publishers
Erscheinungsdatum
1995
Sprache
Englisch
ISBN 10 
0890067260
ISBN 13 
9780890067260
Einband
Gebundene Ausgabe
Anzahl der Seiten
193
Kontakt zum Hersteller
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Verantwortliche Person
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