Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials) - Hardcover
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Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials)
Verlag:
Materials Research Society, 1985
ISBN 10: 0931837111
ISBN 13: 9780931837111
Gebraucht
Hardcover
Anbieter: Redux Books, Grand Rapids, MI, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Very Good. Very good hardcover. No DJ. Text is clean and unmarked. Covers show very minor shelf wear. Bindings tight, hinged strong.; 100% Satisfaction Guaranteed! Ships same or next business day! Bestandsnummer des Verkäufers 111609260027
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Microscopic Identification of Electronic Defects in Semiconductors (Materials Research Society Symposia Proceedings, Volume 46)
Verlag:
Materials Research Society, 1985
ISBN 10: 0931837111
ISBN 13: 9780931837111
Gebraucht
Hardcover
Anbieter: BookDepart, Shepherdstown, WV, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: UsedGood. Hardcover; symposium held April 15-18, 1985, in San Francisco; fading and shelf wear to exterior; binding slightly cocked; scrape to side edge of front cover; note written on table of contents page, otherwise text is clean; former owner's stamping inside rear board; contents in good condition. Bestandsnummer des Verkäufers 64117