MOS Interface Physics, Process and Characterization - Softcover

Wang, Shengkai; Wang, Xiaolei

Softcover

ISBN 10: 103210628X ISBN 13: 9781032106281

Verlag: CRC Press, 2021

Inhaltsangabe

The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.

Über diesen Titel

Über die Autorin bzw. den Autor

Shengkai Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the University of Tokyo in 2011 and has been engaged in Ge, III-V, SiC in MOS technology. He has published more than 100 papers and authorized 40+ patents.

Xiaolei Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the Institute of Microelectronics, Chinese Academy of Sciences in 2013 and has been engaged in Si/Ge based MOS technology. He has published more than 100 papers.

Details zur Ausgabe

• Verlag: CRC Press
• Erscheinungsdatum: 2021
• Sprache: Englisch
• ISBN 10: 103210628X
• ISBN 13: 9781032106281
• Einband: Tapa blanda
• Auflage: 1
• Anzahl der Seiten: 174
• Kontakt zum Hersteller: Nicht verfügbar
• Verantwortliche Person: Nicht verfügbar