Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing) - Hardcover

Kumar, Ch Sateesh; Singh, M. Muralidhar; Krishna, Ram

 
9781032375106: Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)

Inhaltsangabe

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

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Über die Autorin bzw. den Autor

Ch Sateesh Kumar

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9781032375113: Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)

Vorgestellte Ausgabe

ISBN 10:  1032375116 ISBN 13:  9781032375113
Verlag: CRC Press, 2024
Softcover