Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing) - Softcover

Kumar, Ch Sateesh ; Singh, M. Muralidhar ; Krishna, Ram

9781032375113: Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)

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ISBN 10: 1032375116 ISBN 13: 9781032375113

Verlag: CRC Press, 2024

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The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

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Verlag: CRC Press
Erscheinungsdatum: 2024
Sprache: Englisch
ISBN 10: 1032375116
ISBN 13: 9781032375113
Einband: Taschenbuch
Auflage: 1
Anzahl der Seiten: 144
Kontakt zum Hersteller: Nicht verf�gbar
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9781032375106: Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)

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ISBN 10: 1032375108 ISBN 13: 9781032375106
Verlag: CRC Press, 2023
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Kumar, Ch Sateesh; Singh, M. Muralidhar; Krishna, Ram

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Advanced Materials Characterization (Paperback)

Ch Sateesh Kumar

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Paperback. Zustand: new. Paperback. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Bestandsnummer des Verk�ufers 9781032375113

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Advanced Materials Characterization

Ch Sateesh Kumar

Verlag: CRC Press, 2024

ISBN 10: 1032375116 ISBN 13: 9781032375113

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Kumar, Ch Sateesh; Singh, M. Muralidhar; Krishna, Ram

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Advanced Materials Characterization

Ch Sateesh Kumar

Verlag: CRC Press, 2024

ISBN 10: 1032375116 ISBN 13: 9781032375113

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ADVANCED MATERIALS CHARACTERIZATION

KUMAR CH SATEESH

Verlag: CRC Press, 2024

ISBN 10: 1032375116 ISBN 13: 9781032375113

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Advanced Materials Characterization

Ch Sateesh Kumar, M. Muralidhar Singh, Ram Krishna

Verlag: Taylor and Francis Ltd, GB, 2024

ISBN 10: 1032375116 ISBN 13: 9781032375113

Neu Paperback

Anbieter: Rarewaves.com USA, London, LONDO, Vereinigtes K�nigreich

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Paperback. Zustand: New. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering. Bestandsnummer des Verk�ufers LU-9781032375113

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