Low Voltage Electron Microscopy: Principles and Applications (RMS - Royal Microscopical Society) - Hardcover

Hardcover

ISBN 10: 111997111X ISBN 13: 9781119971115

Verlag: Wiley, 2013

Inhaltsangabe

Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing.

It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before.

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Über die Autorin bzw. den Autor

David C. Bell received his PhD in physics from the University of Melbourne, Australia in 1997 and completed his postdoctoral studies at MIT in 1999. He was research faculty and principal investigator at the University of Minnesota from 2000 to 2002. In 2003, he joined the Center for Nanoscale Systems at Harvard University as a principal scientist and became the Manager for Imaging and Analysis in 2007. He has been a lecturer in applied physics at Harvard since 2003 and is a teaching professor at the Harvard Extension School. In 2007, he was a visiting scientist at the Department of Materials, Oxford University, UK. Dr Bell is one of the renowned experts in the field of elemental analysis using electron microscopy (TEM and STEM) and has co-authored a book on this subject. He has authored more than 70 research papers on the subjects of microscopy, materials science and biology and holds several patents. He is an elected Fellow of the Royal Microscopical Society, UK.

Natasha Erdman received her Ph.D. in Materials Science and Engineering from Northwestern University (Chicago, IL) in 2002. After completing her Ph.D. she worked as a Senior Research Chemist at UOP LLC (currently Honeywell) in Des Plaines, IL focusing on investigation of structure-properties relationship in various catalysts using electron microscopy techniques. In 2004 Dr. Erdman as joined JEOL USA Inc., and currently serves as an SEM and Ion-Beam Product Manager. She has authored over 30 peer-reviewed papers on the subjects of microscopy, materials science, chemistry and biology and is a renowned expert on ion-beam based sample preparation techniques for electron microscopy.

Von der hinteren Coverseite

This timely book delves into the rapidly developing, and cutting-edge field, of low-voltage electron microscopy that has only recently become available due to the rapid developments in the electron optics design and image processing. Low-voltage techniques are particularly crucial in nanotechnology and the study of surface related phenomena, allowing researchers to observe materials as never before.

Contributions in this book provide an overview of the different low-voltage microscope techniques for research, essentially providing a handbook for scientists working in this field.

Low Voltage Electron Microscopy: Principles and Applications focuses on the recent advances in this field, covering topics in TEM, SEM, and STEM, including:

• New developments in microscope design and improvement in operation.
• Developments and improvements to existing detector technologies.
• Novel applications of low voltage for imaging and microanalysis of nanomaterials, biological specimens as well as beam sensitive materials.
• A discussion dedicated to the unique electron optics designs for SEM and TEM and comparison to the emerging field of He ion microscopy.

This topical book highlights the relevant applications of low-voltage microscopy to materials science, nanotechnology and biological research, covering topics such as imaging techniques and elemental microanalysis, and addressing the issues associated with sample preparation requirements for low-voltage imaging and analysis. It will serve as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology. Edited by two eminently qualified scientists, with contributions from leading researchers, this is the first book in the field to give a description of low voltage electron microscopy as a whole.

Aus dem Klappentext

This timely book delves into the rapidly developing, and cutting-edge field, of low-voltage electron microscopy that has only recently become available due to the rapid developments in the electron optics design and image processing. Low-voltage techniques are particularly crucial in nanotechnology and the study of surface related phenomena, allowing researchers to observe materials as never before.

Contributions in this book provide an overview of the different low-voltage microscope techniques for research, essentially providing a handbook for scientists working in this field. 

Low Voltage Electron Microscopy:  Principles and Applications focuses on the recent advances in this field, covering topics in TEM, SEM, and STEM, including:

• New developments in microscope design and improvement in operation.
• Developments and improvements to existing detector technologies.
• Novel applications of low voltage for imaging and microanalysis of nanomaterials, biological specimens as well as beam sensitive materials.
• A discussion dedicated to the unique electron optics designs for SEM and TEM and comparison to the emerging field of He ion microscopy.

This topical book highlights the relevant applications of low-voltage microscopy to materials science, nanotechnology and biological research, covering topics such as imaging techniques and elemental microanalysis, and addressing the issues associated with sample preparation requirements for low-voltage imaging and analysis. It will serve as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology. Edited by two eminently qualified scientists, with contributions from leading researchers, this is the first book in the field to give a description of low voltage electron microscopy as a whole.

 

Details zur Ausgabe

• Verlag: Wiley
• Erscheinungsdatum: 2013
• Sprache: Englisch
• ISBN 10: 111997111X
• ISBN 13: 9781119971115
• Einband: Gebundene Ausgabe
• Auflage: 1
• Anzahl der Seiten: 238
• Herausgeber: Bell David C., Erdman Natasha
• Kontakt zum Hersteller: Wiley-VCH GmbH; product_safety@wiley.com; ; Boschstrasse 12; Weinheim; 69469; Deutschland