Optical Methods of Measurement: Wholefield Techniques, Second Edition (Optical Science and Engineering) - Softcover

Buch 57 von 98: Optical Science and Engineering

Sirohi, Rajpal

 
9781138115491: Optical Methods of Measurement: Wholefield Techniques, Second Edition (Optical Science and Engineering)

Inhaltsangabe

Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections.

The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity.

This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.

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Über die Autorin bzw. den Autor

Rajpal S. Sirohi is currently the vice chancellor of Amity University. Prior to this, he was the vice chancellor of Barkatullah University and director of the Indian Institute of Technology Delhi. The recipient of many international awards and author of more than 400 papers, Dr. Sirohi is involved with research concerning optical metrology, optical instrumentation, holography, and speckle phenomenon.

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Weitere beliebte Ausgaben desselben Titels

9781574446975: Optical Methods of Measurement: Wholefield Techniques, Second Edition (Optical Science and Engineering, 146, Band 146)

Vorgestellte Ausgabe

ISBN 10:  1574446975 ISBN 13:  9781574446975
Verlag: Taylor & Francis Inc, 2009
Hardcover