Nist Measurement Services: Fast Repetitive Pulse Transition Parameters, 50 O (Classic Reprint) - Softcover
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Excerpt from Nist Measurement Services<br/><br/>This technique is only applicable when using particular diode-based sampling circuits provided by certain manufacturers. In these particular sampling circuits, if the offset level of the sampler is a value other than 0 V, the sampling head generates or kicks out a pulse each time it samples a signal It has been assumed that the pulse so generated is equivalent to the impulse response of the sampling head. We have checked that assumption and found that it introduces an uncertainty of only about ps in the impulse response estimate of the sampling head. The nose-to-nose technique uses three sampling heads and two oscilloscope mainframes. The inputs of two sampling heads, each in a separate mainframe, are connected together in such a way as to make them appear nose-to-nose. One sampling head is made to kick-out a pulse and the other sampling head is used to acquire the kick-out pulse. However, the strobe pulse, which is generated by the trigger and initiates the sampling event, feeds through the sampling diode and appears as part of the measured kick-out waveform. This can be removed since the polarity of the strobe pulse contribution does not change with the offset voltage polarity whereas the kick out pulse contribution does. Two kick  out waveforms are acquired, one with an offset voltage polarity opposite from the other, and a difference waveform is calculated by dividing the difference of the two waveforms by two. The resulting difference waveform is an estimate of the desired kick-out pulse. Each of the three sampling heads, indicated below by the letters a, b and c, are used sequentially as a sampler and as a pulse generator. The following equations represent how the impulse response estimate is obtained from these measurements.
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Nist Measurement Services: Fast Repetitive Pulse Transition Parameters, 50 Î
Print-on-DemandAnbieter: Forgotten Books, London, Vereinigtes Königreich
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Paperback. Zustand: New. Print on Demand. This book explores fast repetitive pulse transition parameters, a measurement relevant to semiconductor devices, in a structured manner, moving from basic definitions to advanced topics. It provides a comprehensive guide to the theory, methods, and tools necessary for understanding and characterizing these parameters. The author, an expert in the field, delves into the historical development of pulse parameter measurements, examining the evolution of techniques and instruments used over time. The book is meticulously researched and presents insights gained through extensive practical experience, making it an invaluable resource for researchers, engineers, and students working with high-speed electronics and pulse measurement systems. The in-depth analysis and practical guidance provided in this book will greatly enhance the reader's understanding of this specialized area of electrical engineering. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Bestandsnummer des Verkäufers 9781390413625_0
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