Inhaltsangabe
Excerpt from Using a Tem Cell for Emc Measurements of Electronic Equipment<br/><br/>Various approaches have been investigated to find ways by which to increase the test volume available in a cell without reducing its upper useful frequency. One is to design the cell with an off  set septum. Ah asymmetric or offset septum cell was fabricated as shown in the cross-sectional drawings of figure 12. The E-field distributions above and below the septum of this cell are shown in figure 13. This cell offers approximately 29% greater test volume in its lower half space than a symmetric cell of similar size with an equivalent high-frequency cutoff and resonance limitation. This additional test space, however, comes at the price of less test field uniformity and greater difficulty in using the cell at multimode frequencies. A previous publication comparing the characteristics of this cell with a symmetric cell of similar size is available for further study, if desired [8.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Weitere beliebte Ausgaben desselben Titels
Suchergebnisse für Using a Tem Cell for Emc Measurements of Electronic...
Foto des Verkäufers
Using a Tem Cell for Emc Measurements of Electronic Equipment (Classic Reprint)
Print-on-DemandAnbieter: Forgotten Books, London, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
Paperback. Zustand: New. Print on Demand. This book takes an in-depth look at the use of TEM cells for electromagnetic measurements of electronic equipment. Extensive step-by-step procedures are provided for using a TEM cell to perform either radiated electromagnetic susceptibility testing or for measuring radiated electromagnetic emissions from electronic/electromechanical equipment. Written by experts in the field, the book begins with a history of TEM cells and their development, then provides a detailed physical and electrical description of TEM cells and explains how to use them for both radiated susceptibility and emanation measurements. The author provides a brief error analysis associated with the measurement technique, giving the reader a clear understanding of the limitations of TEM cells. An invaluable resource for potential users of TEM cells and those who need to minimize problems often encountered when performing EMC measurements. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Bestandsnummer des Verkäufers 9781390511246_0
Neu kaufen
EUR 17,03
Versand gratis
Versand von Vereinigtes Königreich nach USA
Versand von Vereinigtes Königreich nach USA
Anzahl: Mehr als 20 verfügbar