Verwandte Artikel zu Introduction to Advanced System-on-Chip Test Design...
Introduction to Advanced System-on-Chip Test Design and Optimization: 29 (Frontiers in Electronic Testing) - Hardcover
Inhaltsangabe
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Über die Autorin bzw. den Autor
Dr. Erik Larsson is an assistant professor at Linköpings University in Sweden, and he is an active member of the IEEE Testing and Circuits & Systems societies
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
- VerlagSpringer
- Erscheinungsdatum2005
- ISBN 10 1402032072
- ISBN 13 9781402032073
- EinbandTapa dura
- SpracheEnglisch
- Anzahl der Seiten412
- Kontakt zum HerstellerNicht verfügbar
Neu kaufen
Diesen Artikel anzeigen
EUR 136,16
Gratis für den Versand innerhalb von/der Deutschland
Versandziele, Kosten & Dauer
Suchergebnisse für Introduction to Advanced System-on-Chip Test Design...
Foto des Verkäufers
Introduction to Advanced System-on-Chip Test Design and Optimization.
Anbieter: books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Deutschland
Verkäuferbewertung 5 von 5 Sternen
gebundene Ausgabe. Zustand: Gut. 388 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel.); Schnitt und Einband sind etwas staubschmutzig; der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. Text in ENGLISCHER Sprache! Sprache: Englisch Gewicht in Gramm: 860. Bestandsnummer des Verkäufers 1593690
Anzahl: 1 verfügbar
Foto des Verkäufers
Introduction to Advanced System-on-Chip Test Design and Optimization
Print-on-DemandAnbieter: moluna, Greven, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Gebunden. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. System perspective to SOC test design. Overview of test problems and their modelingTest scheduling overview, extensive reference list Applicable for Master students and PhD-students working in the test field. Could also be good for research. Bestandsnummer des Verkäufers 4093246
Anzahl: Mehr als 20 verfügbar
Beispielbild für diese ISBN
INTRODUCTION TO ADVANCED SYSTEM-ON-CHIP TEST DESIGN AND OPTIMIZATION
Verlag:
Springer-Verlag, Netherlands, 2005
ISBN 10: 1402032072
ISBN 13: 9781402032073
Gebraucht
Hardcover
Erstausgabe
Anbieter: J. W. Mah, Burnaby, BC, Kanada
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Near Fine. Zustand des Schutzumschlags: No Dust Jacket. 1st. (NETH) Presumed 1st edition Ownership stamp to top edge of pages, small ownerhsip label to the back of the cover, no other markings, Near Fine; no dust jacket as published. Hardcover, 388pp, index, diagrams. This book gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. (2.5 JM 0322 Size: 8vo - over 7¾" - 9¾". Bestandsnummer des Verkäufers 07175
Anzahl: 1 verfügbar
Foto des Verkäufers
Introduction to Advanced System-on-Chip Test Design and Optimization
Verlag:
Springer US, Springer US Nov 2005, 2005
ISBN 10: 1402032072
ISBN 13: 9781402032073
Neu
Hardcover
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Buch. Zustand: Neu. Neuware -SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 408 pp. Englisch. Bestandsnummer des Verkäufers 9781402032073
Anzahl: 2 verfügbar
Foto des Verkäufers
Introduction to Advanced System-on-Chip Test Design and Optimization
Print-on-DemandAnbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. 408 pp. Englisch. Bestandsnummer des Verkäufers 9781402032073
Anzahl: 2 verfügbar
Foto des Verkäufers
Introduction to Advanced System-on-Chip Test Design and Optimization
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. Bestandsnummer des Verkäufers 9781402032073
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing, 29)
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. In. Bestandsnummer des Verkäufers ria9781402032073_new
Anzahl: Mehr als 20 verfügbar
Beispielbild für diese ISBN
Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing, 29)
Anbieter: Lucky's Textbooks, Dallas, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. Bestandsnummer des Verkäufers ABLIING23Mar2411530142700
Anzahl: Mehr als 20 verfügbar