Elements of STIL: Principles and Applications of IEEE Std. 1450: 24 (Frontiers in Electronic Testing) - Hardcover

Maston, Gregory A.; Taylor, Tony R.; Villar, Julie N.

Hardcover

ISBN 10: 1402076371 ISBN 13: 9781402076374

Verlag: Springer, 2003

Inhaltsangabe

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Reseña del editor

Standard · Test In. terface ____________________ Language So I was wrong. I was absolutely sure that by having an IEEE Standard defined, reviewed, and accepted, that I wouldn't need to write a book about it as well. The Standard would be the complete reference. And be aware - this book does not serve as a replacement to the IEEE Std. 1450 document. You should have a copy of the Standard as you go through this book. I realized that the Standard would not be the complete reference, about the time that the Working Group started to put notes into the draft proposa- notes to elaborate decisions in the Working Group, but that would be removed in the final draft. Then, once the Standard was accepted I became the central point of contact for people who just picked up the Standard, who didn't have the benefit of the Working Group discussions, who only had available that one final sentence in the Standard and who didn't benefit from the perspective of where those words came from. Sometimes those questions have resulted in clarifications to the Standard. Sometimes I would respond to those questions with more background and perspective as well. It is this additional background and perspective I hope you find in this book.

Reseña del editor

This book elaborates on the definition of STIL, presenting not just the language constructs but the application and the intent of these constructs. This book contains special considerations for applying STIL concepts highlighted under sections titled STIL Conventions. Those sections identify recommendations that are intended to maximize the utility of STIL as it was intended to be applied. Each convention features an icon to identify what application context is affected by this convention.
Elements of STIL should be read by those designing for test, supporting the testing of Integrated Circuits, transporting test data to and from CAD generation environments onto test environments, and supporting digital test applications.

Über diese Auflage

• Verlag: Springer
• Erscheinungsdatum: 2003
• ISBN 10: 1402076371
• ISBN 13: 9781402076374
• Einband: Tapa dura
• Anzahl der Seiten: 316