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Testing Static Random Access Memories: Defects, Fault Models and Test Patterns: 26 (Frontiers in Electronic Testing) - Hardcover
Inhaltsangabe
Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed.
Features:
-Fault primitive based analysis of memory faults,
-A complete framework of and classification memory faults,
-A systematic way to develop optimal and high quality memory test algorithms,
-A systematic way to develop test patterns for any multi-port SRAM,
-Challenges and trends in embedded memory testing.
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From the reviews:
"Static random access memories (SRAMs) enjoy a strategic position in the microelectronic industry. ... This book concentrates on the study of fault modeling, testing and test strategies for SRAMs. ... The book provides a well-written coverage in the area of single-, two- and n-port SRAM testing, fault modeling, and simulation. It is well-organized and very timely. ... The book promises to make valuable contribution to the education of graduate students ... . I highly recommend this book ... ." (Mile Stojcev, Microelectronics Reliability, Vol. 45, 2005)
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Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed.
Features:
-Fault primitive based analysis of memory faults,
-A complete framework of and classification memory faults,
-A systematic way to develop optimal and high quality memory test algorithms,
-A systematic way to develop test patterns for any multi-port SRAM,
-Challenges and trends in embedded memory testing.
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Testing Static Random Access Memories
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Gebunden. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Testing Static Random Access Memories covers testing of one of the important semiconductor memories types it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical ackno. Bestandsnummer des Verkäufers 4095290
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Testing Static Random Access Memories
Verlag:
Springer US, Springer New York Mär 2004, 2004
ISBN 10: 1402077521
ISBN 13: 9781402077524
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Buch. Zustand: Neu. Neuware -Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed.Features:Fault primitive based analysis of memory faultsA complete framework of and classification memory faultsA systematic way to develop optimal and high quality memory test algorithmsA systematic way to develop test patterns for any multi-port SRAMChallenges and trends in embedded memory testing.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 244 pp. Englisch. Bestandsnummer des Verkäufers 9781402077524
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Testing Static Random Access Memories
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Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing. 244 pp. Englisch. Bestandsnummer des Verkäufers 9781402077524
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Testing Static Random Access Memories : Defects, Fault Models And Test Patterns (frontiers In Electronic Testing)
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Testing Static Random Access Memories : Defects, Fault Models And Test Patterns (frontiers In Electronic Testing)
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Testing Static Random Access Memories : Defects, Fault Models and Test Patterns
Verlag:
Springer US, Springer New York, 2004
ISBN 10: 1402077521
ISBN 13: 9781402077524
Neu
Hardcover
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Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing. Bestandsnummer des Verkäufers 9781402077524
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Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing, 26)
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Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing, 26)
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