As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation. Traditionally, static timing analysis tools have ignored cross coupling effects between wires altogether. Newer tools simply approximate the coupling capacitance by a 2X Miller factor in order to compute the worst case delay. The latter approach not only reduces delay calculation accuracy, but can also be shown to underestimate the delay in certain scenarios.
This book describes accurate but conservative methods for computing delay variation due to coupling. Furthermore, most of these methods are computationally efficient enough to be employed in a static timing analysis tool for complex integrated digital circuits. To achieve accuracy, a more accurate computation of the Miller factor is derived. To achieve both computational efficiency and accuracy, a variety of mechanisms for pruning the search space are detailed, including:
-Spatial pruning - reducing aggressors to those in physical proximity,
-Electrical pruning - reducing aggressors by electrical strength,
-Temporal pruning - reducing aggressors using timing windows,
-Functional pruning - reducing aggressors by Boolean functional analysis.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Anbieter: Friends of the Library Bookstore, Eau Claire, WI, USA
Hardcover. Zustand: Very Good. No Jacket. The binding is tight and the spine is smooth. The cover has a couple of minor dents along the lower half in front and a slight dent along the front edge, near the middle. The bottom corners are lightly bumped. The pages are clean and unmarked and the book appears to be only lightly used. The previous owned has written their name on the inside of the front cover at the top but there are no other marks inside. From the back cover: "All signoff analyses-timing, coupling, power, temperature, and reliability-rely on the analysis of crosstalk noise. This book is an important contribution to the field." 113 pp. Shelf: D-2. Bestandsnummer des Verkäufers 251102LW
Anzahl: 1 verfügbar
Anbieter: GreatBookPrices, Columbia, MD, USA
Zustand: New. Bestandsnummer des Verkäufers 3401008-n
Anzahl: Mehr als 20 verfügbar
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. Bestandsnummer des Verkäufers ABBB-160954
Anbieter: Basi6 International, Irving, TX, USA
Zustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service. Bestandsnummer des Verkäufers ABEOCT25-155598
Anbieter: California Books, Miami, FL, USA
Zustand: New. Bestandsnummer des Verkäufers I-9781402080913
Anzahl: Mehr als 20 verfügbar
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Zustand: New. In. Bestandsnummer des Verkäufers ria9781402080913_new
Anzahl: Mehr als 20 verfügbar
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation. Traditionally, static timing analysis tools have ignored cross coupling effects between wires altogether. Newer tools simply approximate the coupling capacitance by a 2X Miller factor in order to compute the worst case delay. The latter approach not only reduces delay calculation accuracy, but can also be shown to underestimate the delay in certain scenarios. This book describes accurate but conservative methods for computing delay variation due to coupling. Furthermore, most of these methods are computationally efficient enough to be employed in a static timing analysis tool for complex integrated digital circuits. To achieve accuracy, a more accurate computation of the Miller factor is derived. To achieve both computational efficiency and accuracy, a variety of mechanisms for pruning the search space are detailed, including: -Spatial pruning - reducing aggressors to those in physical proximity, -Electrical pruning - reducing aggressors by electrical strength, -Temporal pruning - reducing aggressors using timing windows, -Functional pruning - reducing aggressors by Boolean functional analysis. 132 pp. Englisch. Bestandsnummer des Verkäufers 9781402080913
Anzahl: 2 verfügbar
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
Zustand: New. Bestandsnummer des Verkäufers 3401008-n
Anzahl: Mehr als 20 verfügbar
Anbieter: moluna, Greven, Deutschland
Gebunden. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation. Traditionally, st. Bestandsnummer des Verkäufers 4095381
Anzahl: Mehr als 20 verfügbar
Anbieter: Books Puddle, New York, NY, USA
Zustand: New. pp. 132. Bestandsnummer des Verkäufers 26287320
Anzahl: 4 verfügbar