Handbook of Charged Particle Optics - Hardcover

Hardcover

ISBN 10: 1420045547 ISBN 13: 9781420045543

Verlag: Taylor & Francis Inc, 2008

Inhaltsangabe

With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments.

The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work.

Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.

Über diesen Titel

Über die Autorin bzw. den Autor

Jon Orloff

Details zur Ausgabe

• Verlag: Taylor & Francis Inc
• Erscheinungsdatum: 2008
• Sprache: Englisch
• ISBN 10: 1420045547
• ISBN 13: 9781420045543
• Einband: Gebundene Ausgabe
• Auflage: 2
• Anzahl der Seiten: 665
• Herausgeber: Orloff Jon
• Kontakt zum Hersteller: Nicht verfügbar
• Verantwortliche Person: Taylor & Francis Verlag GmbH; GPSR@taylorandfrancis.com; ; Kaufingerstraße 24, 80331 München, Germany; München; Deutschland