Extreme Statistics in Nanoscale Memory Design - Softcover
Buch 24 von 34: Integrated Circuits and Systems
Inhaltsangabe
Extreme Statistics in Memories.- Statistical Nano CMOS Variability and Its Impact on SRAM.- Importance Sampling-Based Estimation: Applications to Memory Design.- Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics.- Yield Estimation by Computing Probabilistic Hypervolumes.- Most Probable Point-Based Methods.- Extreme Value Theory: Application to Memory Statistics.
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