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Alle Exemplare der Ausgabe mit dieser ISBN anzeigen:Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. As a result, repair techniques have been indispensable for nano-scale memories. Without these techniques, even modern MPUs/ SoCs, in which memories have dominated the area and performance, could not have been designed successfully.
This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.
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Buchbeschreibung Hardcover. Zustand: new. Bestandsnummer des Verkäufers 9781441979575
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Buchbeschreibung Zustand: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Bestandsnummer des Verkäufers ria9781441979575_lsuk
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Buchbeschreibung Zustand: New. Bestandsnummer des Verkäufers ABLIING23Mar2411530297487
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Buchbeschreibung Zustand: New. Bestandsnummer des Verkäufers 12024556-n
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Buchbeschreibung Zustand: New. Bestandsnummer des Verkäufers 12024556-n
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Buchbeschreibung Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors' long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability. 218 pp. Englisch. Bestandsnummer des Verkäufers 9781441979575
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Buchbeschreibung Gebunden. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents the first comprehensive reference to reliability and repair techniques for nano-scale memoriesCovers both the mathematical foundations and engineering applications of yield and reliability in nano-scale memoriesIncludes a variety o. Bestandsnummer des Verkäufers 4176479
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Buchbeschreibung Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors' long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability. Bestandsnummer des Verkäufers 9781441979575
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Buchbeschreibung Zustand: New. Written from years of experience with developing memories and low-voltage CMOS circuits, Nanoscale Memory Repair describes yield and reliability issues in terms of mathematics and engineering. Readers will find a detailed explanation of the various yield models and calculations. Series: Integrated Circuits and Systems. Num Pages: 218 pages, biography. BIC Classification: TBD; TJFC. Category: (P) Professional & Vocational. Dimension: 239 x 159 x 20. Weight in Grams: 478. . 2011. Hardback. . . . . Bestandsnummer des Verkäufers V9781441979575
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Buchbeschreibung Zustand: New. Written from years of experience with developing memories and low-voltage CMOS circuits, Nanoscale Memory Repair describes yield and reliability issues in terms of mathematics and engineering. Readers will find a detailed explanation of the various yield models and calculations. Series: Integrated Circuits and Systems. Num Pages: 218 pages, biography. BIC Classification: TBD; TJFC. Category: (P) Professional & Vocational. Dimension: 239 x 159 x 20. Weight in Grams: 478. . 2011. Hardback. . . . . Books ship from the US and Ireland. Bestandsnummer des Verkäufers V9781441979575
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