Advances in X-Ray Analysis: Volume 35B - Softcover

 
9781461365327: Advances in X-Ray Analysis: Volume 35B
Softcover
ISBN 10: 1461365325 ISBN 13: 9781461365327
Verlag: Springer, 2012

Inhaltsangabe

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

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Verlag
Springer
Erscheinungsdatum
2012
Sprache
Englisch
ISBN 10 
1461365325
ISBN 13 
9781461365327
Einband
Taschenbuch
Anzahl der Seiten
648
Herausgeber
Barrett C.S., Gilfrich John V., Huang Ting C., Jenkins Ron, McCarthy G.J., Predecki Paul K., Ryon R., Smith Deane K.
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