Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing) - Softcover

 
9781475782912: Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing)
Softcover
ISBN 10: 1475782918 ISBN 13: 9781475782912
Verlag: Springer, 2013

Inhaltsangabe

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.

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Reseña del editor

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.

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Verlag
Springer
Erscheinungsdatum
2013
Sprache
Englisch
ISBN 10 
1475782918
ISBN 13 
9781475782912
Einband
Tapa blanda
Anzahl der Seiten
260
Herausgeber
Nadeau-Dostie Benoit
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
CMN Printpool Inh. Mathis Neumann
https://www.also.com/ec/cms5/en_6000/6000/index.jsp

Friedrich-Karl-Str. 9
Hamburg
Deutschland

Weitere beliebte Ausgaben desselben Titels

9780792386698: Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing)

Vorgestellte Ausgabe

ISBN 10:  0792386698 ISBN 13:  9780792386698
Verlag: Springer, 1999
Hardcover