Verwandte Artikel zu CMOS Test and Evaluation: A Physical Perspective

CMOS Test and Evaluation: A Physical Perspective - Softcover

Bhushan, Manjul; Ketchen, Mark B.

 
9781493947027: CMOS Test and Evaluation: A Physical Perspective
Softcover
ISBN 10: 1493947028 ISBN 13: 9781493947027
Verlag: Springer, 2016

Inhaltsangabe

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

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Über die Autorin bzw. den Autor

Manjul Bhushan is a technical consultant in New York.

Mark Ketchen is a technical consultant in Massachusetts.

Von der hinteren Coverseite

This book extends test structure applications described in Microelectronic Test Struc­tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters.

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Verlag
Springer
Erscheinungsdatum
2016
Sprache
Englisch
ISBN 10 
1493947028
ISBN 13 
9781493947027
Einband
Taschenbuch
Anzahl der Seiten
440
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